Stay Updated with Offers

Get exclusive volume discounts, bulk pricing updates, and new product alerts delivered directly to your inbox.

By subscribing, you agree to our Terms of Service and Privacy Policy.

Quick Support

Direct access to our certified experts

Texas Instruments 8V182512IDGGREP Specialty Function Logic Mil Enhanced 3.3V AB T Scan Test Device

Name: Texas Instruments 8V182512IDGGREP Specialty Function Logic Mil Enhanced 3.3V AB T Scan Test Device
Brand: Texas Instruments

Model8V182512IDGGREP

Contact

Quantity

Secure Checkout

Quality Engagement

Easy change and return

Delivery Available

Function: Scan Test Device with Universal Bus Transceiver

Unit Weight: 262.600 mg

Mounting Style: SMD/SMT

Number of Circuits: 2 Circuit

Supply Voltage - Max: 3.3 V

Propagation Delay Time: 7.7 ns

Maximum Operating Temperature: + 85 C

Minimum Operating Temperature: - 40 C