Ophir Ge/9/5μm Scanning Slit Beam Profiler With NanoScan (700-1800nm)
Contact
Secure Checkout
Quality Engagement
Easy change and return
Delivery Available
Wavelengths: 700-1800nm
Slit size: 5μm
Beam Sizes: 20μm-~6mm
Spatial sampling resolution: 5.3nm-18.3μm
Scan frequency: 1.25, 2.5, 5, 10, 20Hz
Bus Interface: USB 2.0
Sensor Type: Germanium
Compatible Light Sources: CW, Pulsed >25kHz
Power Range: ~10nW - ~10W
Aperture Size: 3.5mm
Scanhead Size: 83mm
Weight: 434g (15.3 ounces)
Operating temperature: 0-50ºC
Humidity: 90%, non-condensing
Scanhead dimensions: 76.8mm L x 63.5mm Ø
CPU clock: 300MHz
Memory clock: 264MHz
Compliance: CE, UKCA, China RoHS
NanoScan Standard: NS2s-Ge/9/5-PRO
Stay Updated with Offers
Get exclusive volume discounts, bulk pricing updates, and new product alerts delivered directly to your inbox.
By subscribing, you agree to our Terms of Service and Privacy Policy.
Quick Support
Direct access to our certified experts

