Mahr XC 2 Contour Measuring Station (50mm,1mN-120mN)

Measuring range: (in Z) 50 mm

Traversing lengths: 0.2 mm to 120 mm

Measuring force: 1 mN to 120 mN

Sampling angle: On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°

Contacting speed(in Z): 0.1 to 1 mm/s

Resolution: In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm),In Z, relative to measuring system: 0.04 µm

Guide deviation: < 1 µm (over 120 mm)

Measuring speed: 0.2 mm/s to 4 mm/s

Positioning speed: In X and return speed: 0.2 to 8 mm/s, In Z: 0.2 to 10 mm/s

Probe arm length: 175 mm, 350 mm

Tip radius: 25

Optional:

Parallel vise, vee-block

Equipment table

Software options:

DXF import option

Tangential elements option

QS-STAT / QS-STAT Plus option