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Weight Device: 1.50kg, 1.65kg with battery.
Dimension: 250mm x 75mm x 270mm (L*W*H)
Excitation source: High-power high-performance X-ray microtube
Target materials: Five target materials of X-ray tube available:gold (Au), silver (Ag), tungsten (W), tantalum (Ta)and palladium (Pd)
Voltage: 35kV-50kV voltage (changeable)
Filter: A variety of selectable filters, automatically adjusted according to different tested objects
Detector: High-resolution Si-Pin detector
Detector refrigeration temperature: Peltier effect semiconductor refrigeration system
Standard film: External 316 standard film/window protection cover (Optional built-in standard film, plus version)
Power supply: 1 lithium battery (7.2v\6600mAh)
Processor: High-performance ARM pulse processor
Data processing: 32G large-capacity data storage card: ≥80,000 sets of data and spectrograms;
Display screen: High-resolution TFT industrial-grade colored high-definition touch screen, it is ergonomic, sturdy, dust-proof, and waterproof, clearly visible under any light conditions
Outline design: The integrated designed body is sturdy, waterproof, dustproof, antifreeze, shockproof, and can be used normally in harsh environments.
Safe operation: ”One key” detection, auto-lock, detection auto-stop functions. The X-ray will automatically be turned off if there is no sample in front of the detection window for 2 seconds. 3/2 of the shell of the device is covered with a 6061 aluminum alloy frame design, with better X-ray blockage.
Detection Report: Customized detection report available as per the customers’ demands
Element analysis: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, zn, Hf, Ta, W, Se, Au, Br, Pb, Bi, Zr, Nb, Mo, Ag, Cd, Sn, Sb, Re, Ir, Pt, Hg, Ru,Rh, Pd, etc
Smaller, quicker,more accurate, and more portable
The K-series have set a new performance standard for handheld XRF. This is the lightest, quickest, and most accurate spectrometer, with a weight of only 1.65kg (battery included). the features of the X-series, such as small size, fast response, and high accuracy, have been integrated into one device. It is specifically designed for NTD and PMI users, and the detection of places that are unreachable, and welds. It has excellent analysis performance to low content Ti v.
K1688 can analyze common alloys in one second or less. The system is built on the Microsoft WINCE platform, which has better compatibility with the computer platform in facilitating data communication. The users who want to use the device need only to know how to use a computer. KMS-Ray patented technology (mirror system design) is adopted in this device. The temporary files generated during system operation will be automatically deleted after the device restarts, and it can run smoothly as a new one for 10 years. One key system test, one step from startup to test, the test has never been so convenient.
X-ray Fluorescence Technology
The K1688 analyzers are configured with powerful miniature X-ray tubes, Si-PIN detectors or highly advanced silicon drift detectors (SDDs), specialized filters, and multibeam optimization for the ultimate in XRF field analysis. The actual overall value of the K1688 analyzer is embodied in the following aspects: it can make correct decisions in real-time without relying on laboratory tests far away from the detection environment.
