Get exclusive volume discounts, bulk pricing updates, and new product alerts delivered directly to your inbox.
By subscribing, you agree to our Terms of Service and Privacy Policy.
Direct access to our certified experts
Coating layer analysis:
+ Elemental analysis range: Li (3)-U (92)
+ Detection limit: 0.005µm
+ Content analysis range: 0.01-80μm (detection limit for different elements is different) 0.1μm (<1pm thin outer coating)
+ Repeatability: 0.1pm (<1pm thin outer coating)
+ Stability: 0.1pm (<1pm thin outer coating)
Composition analysis
+ Elemental analysis range: S (16)-U (92)
+ Detection limit: 2ppm
+ Content analysis range: 2ppm-99%
+ Repeatability: 0.1%
+ Stability: 0.1%
EFP alaorithm: standard configuration
Measuring time: 5-300s
Detector: Si-Pin semiconductor detector
X-ray source: micro-focusing X-ray tube
Collimator: Standard: Φ0.3mm (Φ0.5mm, Φ0.3mm, Φ0.2mm, 0.1×0.3mm) four collimators optional, customized acceptable
Spot diffusivity: <10%
Camera: 1/2.7 color CCD, zoom function
Measure distance: zoom lens 0-30mm
Focus method: high-sensitivity lens, manual focus
Enlargement factor: optical magnification 38-46X, digital magnification 40-200X
Max sample height: 210mm
XY stage: manual high-precision XY stage
Available moving range: 50mmx50mm
Operating environment: 15-30°C, <70%RH
Power: AC220V, 50Hz, 95W
Dimension (LxWxH):545x380×435mm
Weight: 48kg
STANDARD DELIVERY
Main unit: 1pc
Computer: 1pc
Printer: 1pc
Accessory box: 1pc
Twelve element plate: 1pc
Standard plate: 2pcs*
OPTIONAL DELIVERY
Electroplating solution measuring cup: XRF-PT230-MC
Solution Test Membrane: XRF-PT230-SF
