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Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568
Smallest measuring spot XDLM: approx. 0.1 mm
Tungsten microfocus tube (XDLM) as an x-ray source
Proven proportional counter tube detectors for fast measurement
4-fold changeable apertures (XDLM)
3-fold changeable filter (XDLM)
Fixed sample support
Max. Sample weight: 20kg (44Ibs) or 5 kg (11 lbs), with reduced approach travel precision
Max. Sample height 140 mm (5.5in)
Slotted housing for measuring on large printed circuit boards
Video camera for easy fixing of the measurement location
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Certified full-protection devices
Electrical Data
Power source: AC 115 V or AC 230 V 50 / 60 Hz
Power consumption: max. 120 W, without evaluation PC
Protection class: IP40
Dimensions
External dimensions: Width x depth x height (mm): 570 x 760 x 650, [in]: 22 x 30 x 26
Interior dimensions measurement chamber : 460 x 495 x 146, [in]: 18 x 19.5 x 5.7
Weight: 120 kg/265 lbs
Applications
Electroplated, galvanized coatings such as zinc on iron as corrosion protection
Serial testing of mass-produced parts
Analysis of the composition of special steels, e.g. detection of molybdenum in A4
Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
All typical chrome coatings – also new ones such as CrVI
Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
Datasheet
Brochure
