EXFO FTBx-5245 Optical spectrum analyzer

SPECTRAL MEASUREMENT:

Wavelength range (nm): 1250 to 1650

Wavelength uncertainty (nm): ±0.05; ±0.01

Reference : Internal

Resolution bandwidth (RBW) (nm) : 0.065

Wavelength linearity (nm): ±0.01

Wavelength repeatability 2σ (nm) : ±0.003

Analysis mode : WDM, EDFA, drift, spectral transmittance, DFB, FP

POWER MEASUREMENT:

Dynamic range (dBm) (per channel): –80 k to 18

Maximum total safe power (dBm) : 23

Absolute power uncertainty (dB) : ±0.5 l

Power repeatability 2σ (dB): ±0.02

OPTICAL MEASUREMENT:

Optical rejection ratio (dB)::

at 0.2 nm (25 GHz): 35 (40 typical)

at 0.4 nm (50 GHz): 45 (50 typical)

Channel spacing : 25 to 200 GHz, CWDM

PDL (dB): ±0.08

ORL (dB) : ≥40

Measurement time (s) (includes scanning, analysis and display) : <1.0

IN-BAND OSNR MEASUREMENT : FTBx-5245-P only

OSNR dynamic range (dB): >35

OSNR measurement uncertainty (dB): ±0.5

Repeatability (dB) : ±0.2

Data signals : Up to 100 Gbit/s

POL-MUX OSNR MEASUREMENT:

Commissioning assistant:

Modulation formats: Any, including all coherent/Pol-Mux formats like DP-QPSK, DP-BPSK, DP-8-QAM, DP-16-QAM, DP-64-QAM

Data signals : Up to 400 Gbit/s

Measurements time: 1 min and 40 s (100 scans) for trace with all channels on; <5 s for traces with a single channel off.

GENERAL SPECIFICATIONS :

Size (H x W x D): 51 mm x 159 mm x 185 mm (2 in x 6 1/4 in x 7 5/16 in)

Weight : 1.2 kg (2.6 lb)

Temperature:

Operating: 0 °C to 40 °C (32 °F to 104 °F)

Storage: –40 °C to 50 °C (–40 °F to 122 °F)

Relative humidity: 0 % to 95 % noncondensing

Connectors : EI (EXFO UPC universal interface); EA (EXFO APC universal interface)

Datasheet